| AVS 63rd International Symposium & Exhibition | |
| Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | AS+AC-TuM1 Invited Paper Progress Toward Atomic-Scale Tomography Thomas Kelly, CAMECA Instruments Inc. |
| 9:20am | AS+AC-TuM5 Atom Probe Tomography and Electron Microscopy Investigation of Composition and Structure of Functionalized Carbon Chilan Ngo, D.R. Diercks, M.B. Strand, S. Pylypenko, Colorado School of Mines |
| 9:40am | AS+AC-TuM6 Advanced XPS Imaging and Spectromicroscopy: a Review of Current Capabilities Olivier Renault, CEA-University Grenoble Alps, France |
| 11:00am | AS+AC-TuM10 Invited Paper Challenges and Solutions for Confined Volume Characterization in Semiconductor Systems Wilfried Vandervorst, IMEC & KULeuven, Belgium |
| 11:40am | AS+AC-TuM12 Characterization of Protein G B1 Immobilized Gold Nanoparticles using Time of Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy Y.-C. Wang, David Castner, University of Washington |
| 12:00pm | AS+AC-TuM13 What's New in Wetting? Inorganic Nanotubes at a Water Interface - A Molecular View Sidney Cohen, O. Goldbart, I. Kaplan-Ashiri, Weizmann Institute of Science, Israel, P. Glazyrina, Ural Federal University, Russia, H.D. Wagner, Weizmann Institute of Science, Israel, A. Enyashin, Ub Ras, Russia, R. Tenne, Weizmann Institute of Science, Israel |