| AVS 63rd International Symposium & Exhibition | |
| Thin Film | Thursday Sessions |
| Session TF-ThP |
| Session: | Thin Films Poster Session |
| Presenter: | Stanislav Danis, Charles University in Prague, Czech Republic |
| Authors: | T. Malek, Charles University in Prague, Czech Republic S. Danis, Charles University in Prague, Czech Republic L. Matejova, Technical University of Ostrava, Czech Republic M. Cerhova, Czech Academy of Sciences, Czech Republic |
| Correspondent: | Click to Email |
Polycrystalline titania oxide are of great interest recently namely for their photocatalycal properties. Samples of TiO2 could be prepared as polycrystalline powder (nano-powder) and/or in the form of polycrystalline thin films. In our contribution we will present structural studies of thin layers prepared on different substrates (amorphous glass and crystalline silicon) by dip-coating method. A set of layers were analysed all of them synthetized via sol-gel process controlled within reverse micelles of nonionic surfactant Triton X-114 in cyclohexane combined with pressurized water extraction and/or supercritical/pressurized methanol drying. Obtained thin films were heated up to 400oC for 4 hours in order to obtain crystalline phase. However, some amount of non-crystalline phase of TiO2 could be expected due to preparation procedure. In case of powder the amount of the non-crystalline part can be determined using internal standard, for example. Unfortunately, this technique cannot be used in the case of thin layer. We show how to apply PONKCS method [1] in order to at least estimate the amorphous phase concentration within prepared samples on the glass substrate.
The presented work is supported by the Grant Agency of the Czech Republic by the project No.14-23274S.
[1] Scarlett, N.V.Y., Madsen, I.C. (2006), Powder Diffraction, 2006,21(4), 278-284
Keywords: thin films , quantitative phase analysis, amorphous phase