| AVS 63rd International Symposium & Exhibition | |
| Thin Film | Thursday Sessions |
| Session TF-ThP |
| Session: | Thin Films Poster Session |
| Presenter: | Tom Hauffman, Vrije Universiteit Brussel, Belgium |
| Authors: | T. Hauffman, Vrije Universiteit Brussel, Belgium S. Pletincx, Vrije Universiteit Brussel, Belgium K. Marcoen, Vrije Universiteit Brussel, Belgium P. Kerger, Max Planck Institut fur Eisenforschung GmbH (Düsseldorf- Germany), Germany L.I. Fockaert, Technical University of Delft, Netherlands M. Rohwerder, Max Planck Institut fur Eisenforschung GmbH (Düsseldorf- Germany), Germany J.M.C. Mol, Technical University of Delft, Netherlands H. Terryn, Vrije Universiteit Brussel, Belgium |
| Correspondent: | Click to Email |
Polymer/(hydr)oxide/metal systems play an important role in engineering. In aerospace, microelectronics, automotive, packaging and even biomedical industry engineering metals are adhesively bonded by a polymer adhesive. Next to adhesive joints, organic coatings are used in these industries and in construction in order to protect the underlying substrate against atmospheric influences. The interface between the organic layer and the oxide of these hybrid systems is very important as it determines largely the performance of the entire system. However, in which sense this interface is of extreme importance is the topic of a large debate. Although mechanical interlocking has always been put forward as the main force holding hybrid structures, it becomes increasingly clear that interfacial chemical interactions are the key players in hybrid structure durability. Furthermore, the access to the interface of hybrid structures is challenging as it is mostly covered by µm range thick polymer overlayers. The so-called buried interface can only be accessed by using monomeric model compounds or by removing (e.g. by argon sputtering or stripping) the polymeric layer partially [1-5]. However, monomers do not fully represent the interphases to be expected in polymer – metal oxide structures and sputtering alters the interface itself. In this presentation, we will present an innovative approach to study interfacial interactions between metallic oxide layers and polymeric films in a non-destructive, in situ manner. This will be done using ultrathin polymeric films deposited on well-tuned oxides. The interactions will be probed using X-ray Photoelectron Spectroscopy, AFM-TOF-SIMS, Infrared Spectroscopy in a Kretchmann geometry and Near Ambient Pressure X-Ray Photoelectron Spectroscopy.
1. Hauffman, T. Van Lokeren, L. Willem, R. Hubin, A. and Terryn, H. Langmuir 28 (2012) 3167-3173.
2. Bekir, S. Özkanat, Ö. Mol, J. Terryn, H. and Rohwerder, M., Journ. Phys. Chem. C 117 (2013) 4480-4487.
3. Taheri, P. Ghaffari, M. Flores, J. Hannour, F. de Wit, J. Mol, J. and Terryn, H. Journ. Phys. Chem. C 117 (2013) 27480-2792.
4. Wielant, J. Hauffman, T. Blajiev, O. Hausbrand, R. and Terryn, H. Journ. Phys. Chem. C 111 (2007) 13177-13184.
5. Taheri, P. Terryn, H., and Mol, J., Appl. Surf. Sci. 354 (2015) 242-249.