AVS 63rd International Symposium & Exhibition | |
Advanced Ion Microscopy Focus Topic | Thursday Sessions |
Session HI+MI+NS-ThA |
Session: | Ion Beam Based Imaging and Nanofabrication |
Presenter: | Natalie Frese, Bielefeld University, Germany |
Authors: | A. Beyer, Bielefeld University, Germany N. Frese, Bielefeld University, Germany S.T. Mitchell, University of Hawaii A. Bowers, University of Hawaii K. Sattler, University of Hawaii A. Gölzhäuser, Bielefeld University, Germany |
Correspondent: | Click to Email |