| AVS 62nd International Symposium & Exhibition | |
| Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | AS+BI-TuA1 Invited Paper ASSD 30th Anniversary Lecture: 30 Years (ToF-)SIMS of Organic Materials: from Monolayer to 3D Microarea Analysis Birgit Hagenhoff, Tascon GmbH, Germany |
| 3:00pm | AS+BI-TuA3 Characterization of the Buried Interface between a Bacterial-Biofilm Resistant Coating and a Silicon Catheter by using Gas Cluster ToF-SIMS and Raman Microscopy Bonnie Tyler, National Physical Laboratory (NPL), UK, A.L. Hook, M.R. Alexander, University of Nottingham, UK, A. Giovannozzi, INRIM, A. Pelster, H.F. Arlinghaus, University of Muenster, Germany |
| 3:20pm | AS+BI-TuA4 How to Measure Reaction Rates on Surfaces?: Ambient Mass Spectrometry and XPS to Study the Rate of Organic Reactions on Functionalized Surfaces. R. Sen, J. Escorihuela, Han Zuilhof, Wageningen University, Netherlands |
| 4:20pm | AS+BI-TuA7 Surface versus Bulk Chemistry of Reverse Osmosis Membranes Tamlin Matthews, R. Cieslinski, M. Paul, A. Roy, The Dow Chemical Company |
| 4:40pm | AS+BI-TuA8 Effect of Deep UV Irradiation on Polyester Family Polymers Lopamudra Das, M.J. Kelley, College of William and Mary |
| 5:00pm | AS+BI-TuA9 Invited Paper Going beyond State of the Art in SIMS Imaging in the Life-Sciences and for Organic Devices Ian Gilmore, National Physical Laboratory, UK |
| 5:40pm | AS+BI-TuA11 Can In Situ Liquid SIMS Provide Enough Signals for Biology and Environmental Research? Zihua Zhu, Y. Zhou, X. Hua, J. Yu, J.E. Evans, D. Lao, X.-Y. Yu, Pacific Northwest National Laboratory |
| 6:00pm | AS+BI-TuA12 Fundamental Metrology for Tissue Imaging by SIMS - A Study of Cholesterol and Determination of the Argon Cluster Sputtering Yield P.D. Rakowska, M.P. Seah, Rasmus Havelund, I.S. Gilmore, National Physical Laboratory, UK |