Paper IS+AS+SA+SS-MoA9
New Developments in Small Spot and Imaging Near Ambient Pressure XPS

Monday, October 19, 2015, 5:00 pm, Room 211C

Over the last 15 years, Near Ambient Pressure (NAP-) XPS has demonstrated its promising potential in a wide variety of applications. Starting from the Catalysis and Ice paradigm, the focus has shifted towards solid-liquid interfaces, liquid jets and in-situ electrochemistry. Initially, the experiments had to be carried out using advanced synchrotron sources to reach reasonable count rates. But now, the SPECS PHOIBOS 150 NAP offers optimized transmission for electrons, even at pressures up to and above 100mbar, so researchers can now use it with conventional X-ray and UV sources in their own laboratories. Because of the widened application fields, standard XPS is now also attainable when combined with easily adjustable monochromated X-ray sources that offer stable operation, small excitations spots, and high photon flux densities, even in Near Ambient Pressure conditions. The latest designs and results are presented showing small spot performance for spot sizes < 30 µm, while also showcasing the latest implementations of imaging NAP-XPS that uses a new concept allowing for lateral resolved measurements without a compromise in count rate and usability. Highlighting on how sample environments (in situ cells for gases and liquids, electrochemical cells, gas inlets) and integration are both absolutely essential to obtain relevant results from well-defined samples, the presentation will demonstrate the use of NAP-XPS systems for high throughput-XPS measurements, as well as a variety of applications.