| AVS 61st International Symposium & Exhibition | |
| Scanning Probe Microscopy Focus Topic | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:40am | SP+AS+BI+EM+NS+SE+SS-FrM2 2013 ASSD Student Award Talk: New Insights into Nanoscale Adhesion from In Situ TEM Studies Tevis Jacobs, J.A. Lefever, University of Pennsylvania, J. Liu, University of Wisconsin-Madison, D.S. Grierson, SysteMECH LLC, K.E. Ryan, P.L. Keating, J.A. Harrison, United States Naval Academy, K.T. Turner, R.W. Carpick, University of Pennsylvania |
| 9:40am | SP+AS+BI+EM+NS+SE+SS-FrM5 Nanoscale Mapping of the W/Si(001) Schottky Barrier using Ballistic Electron Emission Microscopy Christopher Durcan, University of Albany-SUNY, V.P. LaBella, University at Albany-SUNY |
| 10:00am | SP+AS+BI+EM+NS+SE+SS-FrM6 Local Probing of Superconductivity in Half Heusler Compounds Hongwoo Baek, NIST & Seoul National University, Republic of Korea, J. Ha, D. Zhang, NIST/Maryland Nano Center, University of Maryland, Y. Nakajima, P.S. Syers, X. Wang, K. Wang, J. Paglione, University of Maryland, Y. Kuk, Seoul National University, Republic of Korea, J.A. Stroscio, NIST |
| 10:40am | SP+AS+BI+EM+NS+SE+SS-FrM8 Multimodal Intermittent Contact Atomic Force Microscopy: Topographical Imaging, Compositional Mapping, Subsurface Visualization and Beyond Santiago Solares, George Washington University |