AVS 61st International Symposium & Exhibition | |
Spectroscopic Ellipsometry Focus Topic | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
8:20am | EL+AS+BI+EM+SS-FrM1 Invited Paper Multimodal Optical and Mass Spectrometric Imaging of Cells and Tissues DaeWon Moon, DGIST, Republic of Korea |
9:00am | EL+AS+BI+EM+SS-FrM3 Sum Decomposition of Mueller Matrices from Beetle Cuticles Hans Arwin, R. Magnusson, Linköping University, Sweden, E. Garcia-Caurel, A. de Martino, LPICM-CNRS, Ecole Polytechnique, France, K. Järrendahl, Linköping University, Sweden, R. Ossikovski, LPICM-CNRS, Ecole Polytechnique, France |
9:20am | EL+AS+BI+EM+SS-FrM4 Polymer- and Ceramic-Supported Hybrid Gas Separation Membranes Characterized by Ellipsometry Ioannis A. Mergos, H. Verweij, The Ohio State University |
9:40am | EL+AS+BI+EM+SS-FrM5 Spectroscopic Ellipsometry Methodology for Analysis of Thin Films with Significant Surface Non-idealities: Combining Through-the-Substrate and Film-Side Measurements Jian Li, University of Toledo, L. Mansfield, National Renewable Energy Laboratory, P. Pradhan, University of Toledo, H. Du, S. Glenn, J. Mann, A. Norman, K. Ramanathan, National Renewable Energy Laboratory, R.W. Collins, University of Toledo, G. Teeter, D. Levi, National Renewable Energy Laboratory |
10:00am | EL+AS+BI+EM+SS-FrM6 A Classical Model for Depolarization through Incoherent Superposition of Dipoles Driven by Evanescent Fields Kurt Hingerl, University Linz, Austria |
10:40am | EL+AS+BI+EM+SS-FrM8 The Development Of Highly-Oriented 3D Nanostructures For Use With Ultra-Thin Layer Chromatography And Ellipsometry Erika Pfaunmiller, University of Nebraska Lincoln, D. Peev, D. Sekora, University of Nebraska-Lincoln, S. Beeram, University of Nebraska Lincoln, C. Rice, M. Schubert, T. Hofmann, D. Hage, University of Nebraska-Lincoln |