AVS 61st International Symposium & Exhibition | |
Atom Probe Tomography Focus Topic | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
8:20am | AP+AS+NS+SS-FrM1 Invited Paper Correlative Transmission Electron Microscopy and Atom Probe Tomography of Interfaces in CdTe David Diercks, J.J. Li, C.A. Wolden, B.P. Gorman, Colorado School of Mines |
9:00am | AP+AS+NS+SS-FrM3 Atom Probe Compositional Analysis of Nanoscale Precipitates in Nb-Ti Micro-alloyed Steels Monica Kapoor, G.B. Thompson, University of Alabama, R.M. O'Malley, Nucor Steel |
9:20am | AP+AS+NS+SS-FrM4 Nanoscale Imaging of Li and B in Glass Samples, a Comparison of ToF-SIMS, NanoSIMS, and APT Zihua Zhu, Z.Y. Wang, J. Liu, J. Crum, J.V. Ryan, D.K. Schreiber, J.J. Neeway, Pacific Northwest National Laboratory |
9:40am | AP+AS+NS+SS-FrM5 Invited Paper Application of (S)TEM and Related Techniques to Atom Probe Specimens William Lefebvre, D. Hernandez-Maldonado, F. Cuvilly, F. Moyon, University of Rouen, France |
10:40am | AP+AS+NS+SS-FrM8 Invited Paper APT Analysis of Biological Materials Daniel Perea, J. Liu, J.A. Bartrand, N.D. Browning, J.E. Evans, Pacific Northwest National Laboratory |