AVS 61st International Symposium & Exhibition
    Atom Probe Tomography Focus Topic Friday Sessions

Session AP+AS+NS+SS-FrM
Correlative Surface and Interface Analysis with APT

Friday, November 14, 2014, 8:20 am, Room 301
Moderator: Arun Devaraj, Pacific Northwest National Laboratory


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Click a paper to see the details. Presenters are shown in bold type.

8:20am AP+AS+NS+SS-FrM1 Invited Paper
Correlative Transmission Electron Microscopy and Atom Probe Tomography of Interfaces in CdTe
David Diercks, J.J. Li, C.A. Wolden, B.P. Gorman, Colorado School of Mines
9:00am AP+AS+NS+SS-FrM3
Atom Probe Compositional Analysis of Nanoscale Precipitates in Nb-Ti Micro-alloyed Steels
Monica Kapoor, G.B. Thompson, University of Alabama, R.M. O'Malley, Nucor Steel
9:20am AP+AS+NS+SS-FrM4
Nanoscale Imaging of Li and B in Glass Samples, a Comparison of ToF-SIMS, NanoSIMS, and APT
Zihua Zhu, Z.Y. Wang, J. Liu, J. Crum, J.V. Ryan, D.K. Schreiber, J.J. Neeway, Pacific Northwest National Laboratory
9:40am AP+AS+NS+SS-FrM5 Invited Paper
Application of (S)TEM and Related Techniques to Atom Probe Specimens
William Lefebvre, D. Hernandez-Maldonado, F. Cuvilly, F. Moyon, University of Rouen, France
10:40am AP+AS+NS+SS-FrM8 Invited Paper
APT Analysis of Biological Materials
Daniel Perea, J. Liu, J.A. Bartrand, N.D. Browning, J.E. Evans, Pacific Northwest National Laboratory