AVS 61st International Symposium & Exhibition
    Thin Film Thursday Sessions
       Session TF-ThP

Paper TF-ThP8
Characterization of Fluorine-doped Al2O3 Films Deposited by High-Power Impulse Magnetron Sputtering

Thursday, November 13, 2014, 6:00 pm, Room Hall D

Session: Thin Films Poster Session
Presenter: Bohuei Liao, Instrument Technology Research Center, Taiwan, Republic of China
Authors: B. Liao, Instrument Technology Research Center, Taiwan, Republic of China
C.N. Hsiao, ITRC, NARL, Taiwan, Republic of China
C.C. Lee, National Central University, Taiwan, Republic of China
Correspondent: Click to Email

Fluorine-doped Al2O3 films were deposited by high-power impulse magnetron sputtering with an Al metal target at room temperature. In order to obtain better optical and mechanical properties, films were investigated under different duty cycle and different ratios of O2 to CF4 gas. The optical properties in deep ultraviolet range, microstructure, surface roughness, and crystalline structure, of fluorine-doped Al2O3 films have been studied. The fluorine-doped Al2O3 films deposited with 45/555 duty cycle and 0.6 sccm CF4 has lowest extinction coefficient (5 × 10-4)and highest refractive index (1.70) at 193 nm. Besides, the fluorine-doped Al2O3 films reveal a dense and amorphous structure.