| AVS 61st International Symposium & Exhibition | |
| Thin Film | Monday Sessions |
| Session TF+PS+SE-MoM |
| Session: | Advanced PVD Methods |
| Presenter: | Nicolas Argibay, Sandia National Laboratories |
| Authors: | N. Argibay, Sandia National Laboratories J.E. Mogonye, Sandia National Laboratories R.S. Goeke, Sandia National Laboratories K.M. Hattar, Sandia National Laboratories M.T. Dugger, Sandia National Laboratories S.V. Prasad, Sandia National Laboratories |
| Correspondent: | Click to Email |
In the second part we present the result of investigations of the bulk transport properties, thermal and mechanical stability, and mechanical properties of electron beam codeposited Au-ZnO as a function of composition and temperature (up to a homologous temperature of 0.5). A high throughput method for determining the average grain size in electrically conductive metal-ceramic thin films will be presented, founded on a correlation between grain boundary density and electrical resistivity (Mayadas-Shatzkes and Sondheimer-Fuchs models), and compared to microstructural characterization using backscatter and transmission electron diffraction, SEM, and XPS.
Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-AC04-94AL85000.