AVS 61st International Symposium & Exhibition
    Exhibitor Technology Spotlight Tuesday Sessions
       Session EW-TuM

Paper EW-TuM9
Stylus Profilometry – Bruker’s DektakXTL delivers Innovation in Flexibility and Ease of Use

Tuesday, November 11, 2014, 10:40 am, Room Hall ABC

Session: Exhibitor Technology Spotlight Session
Presenter: Eric Rufe, Bruker
Correspondent: Click to Email

Bruker will present DektakXTL large area stylus profilometry system and advantages of new automated scanning and alignment capabilities, as well as simplified quick acquisition tools for fastest time to data supporting applications in a range of industries including but not limited to flexible electronics, display and touch screen manufacture.