| AVS 60th International Symposium and Exhibition | |
| In Situ Spectroscopy and Microscopy Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| IS-ThP1 Scanning Tunneling Microscopy of the Topological Crystalline Insulator SnTe D. Zhang, J. Ha, NIST and University of Maryland, H. Baek, NIST and Seoul National University, Republic of Korea, Y. Kuk, Seoul National University, Republic of Korea, J.A. Stroscio, Center for Nanoscale Science and Technology, NIST |
| IS-ThP2 In Situ Electrostatic and Thermal Manipulation of Suspended Graphene Membranes W. Bao, K. Myhro, Z. Zhao, Z. Chen, W. Jang, L. Jing, F. Miao, H. Zhang, C. Dames, C.N. Lau, University of California, Riverside |