| AVS 60th International Symposium and Exhibition | |
| Helium Ion Microscopy Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| HI-ThP2 Imaging Nascent Soot Particles: Tiniest Soot Particles are Not Structurally Homogeneous M. Schenk, Bielefeld University, Germany, S. Lieb, University of Southern California, H. Vieker, A. Beyer, A. Gölzhäuser, Bielefeld University, Germany, H. Wang, University of Southern California, K. Kohse-Höinghaus, Bielefeld University, Germany |
| HI-ThP3 Helium Ion Microscopy as a Tool to Investigate Thin Layer Thicknesses H. Vieker, K. Rott, U. Werner, A. Beyer, G. Reiss, A. Gölzhäuser, Bielefeld University, Germany |
| HI-ThP4 Helium Ion Microscopy and Ionoluminescence of Defects G. Hlawacek, V. Veligura, R. van Gastel, H.J.W. Zandvliet, B. Poelsema, University of Twente, Netherlands |