| AVS 60th International Symposium and Exhibition | |
| Helium Ion Microscopy Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:40am | HI-ThM3 Invited Paper Imaging with Helium Ions - A New Detector Regime with New Challenges and New Opportunities J.A. Notte, Carl Zeiss Microscopy |
| 9:20am | HI-ThM5 Invited Paper Interaction of Energetic Ions and Electrons with Two-Dimensional Materials A.V. Krasheninnikov, Aalto University and University of Helsinki, Finland |
| 10:40am | HI-ThM9 Imaging of Graphene Films by Helium Ion Microscope S. Ogawa, T. Iijima, S. Nakaharai, M. Hayashida, S. Sato, National Institute of Advanced Industrial Science and Technology (AIST), Japan |
| 11:00am | HI-ThM10 Secondary Electron Contrast for Few Layer Graphene in Helium Ion Microscope Y. Zhou, H. Zhang, Trinity College Dublin, Ireland |
| 11:20am | HI-ThM11 Monte Carlo Simulations of Helium and Neon Ions Beam Induced Deposition and Etching R.T. Timilsina, The University of Tennessee Knoxville, D.A. Smith, P.D. Rack, The University of Tennessee Knoxville and Oak Ridge National Laboratory |
| 11:40am | HI-ThM12 Helium Ion Microscope; a Single Beam for Imaging and Fabrication E. van Veldhoven, N.B. Koster, F.T. Molkenboer, D.J. Maas, TNO Technical Sciences, Netherlands, H.W. Zandbergen, P.F.A. Alkemade, TU Delft, Netherlands |