AVS 60th International Symposium and Exhibition
    Helium Ion Microscopy Focus Topic Thursday Sessions
       Session HI-ThM

Paper HI-ThM11
Monte Carlo Simulations of Helium and Neon Ions Beam Induced Deposition and Etching

Thursday, October 31, 2013, 11:20 am, Room 203 A

Session: Basics of Helium Ion Microscopy
Presenter: R.T. Timilsina, The University of Tennessee Knoxville
Authors: R.T. Timilsina, The University of Tennessee Knoxville
D.A. Smith, The University of Tennessee Knoxville and Oak Ridge National Laboratory
P.D. Rack, The University of Tennessee Knoxville and Oak Ridge National Laboratory
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The new Gas Field Ion Microscope is able to deposit and etch material at the nanoscale in a highly controlled manner, but in order to exploit this capability it is necessary to have a detailed quantitative model of the process. A Monte Carlo simulation for He+ and Ne+ ion beam induced deposition (and etching) has been developed which provides data in excellent agreement with the observed experimental results over a wide range of experimental conditions. The ion beam induced nanoscale synthesis of PtCx (where x~5) using the trimethyl (methylcyclopentadienyl)platinum(IV) (MeCpPtIVMe3) precursor is investigated by performing Monte Carlo simulations of helium and neon ions integrated with a gas handling routine to mimic the precursor adsorption and decomposition. The simulation results show that the helium beam leads to more lateral growth relative to the neon beam because of its larger interaction volume. The lateral growth of the nanopillars is dominated by molecules deposited via secondary electrons in the both simulations. Using a low precursor residence time of 70µs resulting in an equilibrium coverage of ~ 4%, the neon simulation has a lower deposition efficiency (3.5%) compared to that of the helium simulation (6.5%). At larger residence time (10ms) and consequently larger equilibrium coverage (85%) the deposition efficiencies of helium and neon increased to 49% and 21%, respectively; which is dominated by increased lateral growth rates leading to broader pillars. The nanoscale growth is further studied by varying the ion beam diameter at 10 ms precursor residence time. The study shows that total SE yield decreases with increasing beam diameters for the both ion types. Finally, experimentally we have shown that He ion deposited material has a larger room temperature resistivity (~3.5x104 - 2.2x105 μΩ-cm) and temperature dependent transport behavior consistent with a granular material in the weak intergranular tunnel coupling regime. Conversely Ne ion deposited material has a much lower room temperature resistivity (~600 – 3.0x103 μΩ-cm) and temperature dependent electrical behavior representative of strong intergranular coupling. The Ne ion deposited nanostructure has larger platinum nanoclusters, which is rationalized via Monte-Carlo ion-solid simulations that show the neon energy density deposited during growth is much larger due to the smaller ion range as shown in The observed platinum grain coarsening and subsequently lower resistivity for the Ne ions beam induced deposits is correlated to the enhanced platinum mobility via the enhanced nuclear stopping of the Neon ions.