AVS 60th International Symposium and Exhibition
    Graphene and Other 2D Materials Focus Topic Friday Sessions

Session GR+EM+MS+NS+SP-FrM
2D Materials: Device Physics & Applications

Friday, November 1, 2013, 8:20 am, Room 101 A
Moderators: L. Cao, North Carolina State University, E. Riedo, Georgia Institute of Technology


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:20am GR+EM+MS+NS+SP-FrM1 Invited Paper
Epitaxial Graphene Electronics
J.A. Robinson, The Pennsylvania State University
9:00am GR+EM+MS+NS+SP-FrM3
Direct Transfer of Graphene Devices on Arbitrary Substrates
Z. Razavi Hesabi, C.A. Joiner, T. Roy, E.M. Vogel, Georgia Institute of Technology
9:20am GR+EM+MS+NS+SP-FrM4
1/f Noise in Epitaxial Graphene Field Effect Transistors using Al2O3 and HfO2 High k -Dielectrics
H.K. Chan, Newcastle Univ., UK, V.D. Wheeler, U.S. Naval Research Laboratory (NRL), V.K. Nagareddy, Newcastle Univ., UK, L.O. Nyakiti, NRL, A. Nath, George Mason Univ., R.L. Myers-Ward, Z. Robinson, N.Y. Garces, NRL, M.V. Rao, George Mason Univ., J.P. Goss, N.G. Wright, Newcastle Univ., UK, C.R. Eddy, Jr., NRL, A.B. Horsfall, Newcastle Univ., UK, D.K. Gaskill, NRL
9:40am GR+EM+MS+NS+SP-FrM5 Invited Paper
MoS2 MOSFETs: Dielectrics, Metal Contacts and Scaling
P.D. Ye, Purdue University
10:20am GR+EM+MS+NS+SP-FrM7
Broad Band Dielectric Functions of Graphene and MoS2
W. Li, G. Cheng, National Institute of Standards and Technology (NIST), Y. Liang, Peking Univ., China, K. Xu, NIST, A. Boosalis, Univ. of Nebraska-Lincoln, P.D. Ye, Purdue Univ., A.R. Hight Walker, NIST, X. Liang, Peking Univ., China, T. Hofmann, Univ. of Nebraska-Lincoln, C.A. Richter, D.J. Gundlach, N.V. Nguyen, NIST
10:40am GR+EM+MS+NS+SP-FrM8
Measurement of Charge Doping of Graphene in a Metal/Graphene/Dielectric Sandwich Structure by C-1s Core Level X-ray Photoelectron Spectroscopy
A. Dahal, M. Batzill, R. Addou, H. Coy-Diaz, J. Lallo, University of South Florida