| AVS 60th International Symposium and Exhibition | |
| Atom Probe Tomography Focus Topic | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | AP+AS+SS-TuA1 Multivariate Analysis of Atom Probe Tomography Data: Methods to Simplify Factor Interpretation M.R. Keenan, Consultant, V. Smentkowski, General Electric Global Research Center |
| 2:40pm | AP+AS+SS-TuA3 Invited Paper The Renaissance in Metallurgical Design and the Role of Atom Probe Microscopy S.P. Ringer, The University of Sydney, Australia |
| 4:40pm | AP+AS+SS-TuA9 Atom Probe Tomography Investigations of Surface and Grain Boundary Oxidation in Ni-Cr Alloys Exposed to High-Temperature Water D.K. Schreiber, M.J. Olszta, S.M. Bruemmer, Pacific Northwest National Laboratory |
| 5:00pm | AP+AS+SS-TuA10 Space Charge Effects in Atom Probe tomography I. Blum, F. Vurpillot, L. Rigutti, A. Gaillard, D. Shinde, J. Houard, A. Vella, B. Deconihout, Groupe de Physique des Matériaux, France |
| 5:20pm | AP+AS+SS-TuA11 Atom Probe Analysis and Challenges to Study a High-k Dielectric Grown on GaN B. Mazumder, X. Liu, F. Wu, U.K. Mishra, J.S. Speck, University of California, Santa Barbara |
| 5:40pm | AP+AS+SS-TuA12 A Correlated Micro-Photoluminescence, Scanning Transmission Electron Microscopy and Atom Probe Tomography Experiment on the Same Nano-Object Containing a Set of InGaN/GaN Multi-Quantum Wells L. Rigutti, I. Blum, D. Shinde, D. Hernandez Maldonado, W. Lefebvre, J. Houard, A. Vella, F. Vurpillot, Groupe de Physique des Matériaux, France, M. Tchernycheva, Institut d'Electronique Fondamentale, France, C. Durand, J. Eymery, CEA/CNRS/Université Joseph Fourier, France, B. Deconihout, Groupe de Physique des Matériaux, France |