| AVS 60th International Symposium and Exhibition | |
| Atom Probe Tomography Focus Topic | Tuesday Sessions |
| Session AP+AS+SS-TuA |
| Session: | Microstructural and Interface Analysis of Metals Subjected to Various Conditions |
| Presenter: | M.R. Keenan, Consultant |
| Authors: | M.R. Keenan, Consultant V. Smentkowski, General Electric Global Research Center |
| Correspondent: | Click to Email |