AVS 60th International Symposium and Exhibition
    Surface Science Wednesday Sessions
       Session SS+AS+NS+SP-WeA

Invited Paper SS+AS+NS+SP-WeA7
Species-Selective Atomic Resolution Imaging with Scanning Probe Methods

Wednesday, October 30, 2013, 4:00 pm, Room 202 A

Session: Single Molecules at Surfaces: Structure and Dynamics
Presenter: U.D. Schwarz, Yale University
Authors: H. Monig, University of Muenster, Germany
M. Todorovic, Universidad Autónoma de Madrid, Spain
M.Z. Baykara, Bilkent University, Turkey
J. Goetzen, Yale University
O.E. Dagdeviren, Yale University
T.C. Schwendemann, Southern Connecticut State University
L. Rodrigo, Universidad Autónoma de Madrid, Spain
E.I. Altman, Yale University
R. Perez, Universidad Autónoma de Madrid, Spain
U.D. Schwarz, Yale University
Correspondent: Click to Email
Despite the evolution of scanning probe microscopy (SPM) into a powerful set of techniques that image surfaces and map their properties down to the atomic level, significant limitations in both imaging and mapping persist. Currently, typical SPM capabilities qualitatively record only one property at a time and at a fixed distance from the surface. Furthermore, the probing tip’s apex is chemically and electronically undefined, complicating data interpretation. To overcome these limitations, we started to integrate significant extensions to existing SPM approaches. First, we extended noncontact atomic force microscopy with atomic resolution to three dimensions by adding the capability to quantify the tip-sample force fields near a surface with picometer and piconewton resolution. Next, we gained electronic information by recording the tunneling current simultaneously with the force interaction. We then moved on to study the influence of tip chemistry and asymmetry on the recorded interactions. Through a combination of experimental work and theoretical analysis, we show how specific atomic species can be selectively imaged in both the force and the current channels depending on the choice of imaging parameters and tip chemistry. Applications to metal oxides are shown. From this platform, we present our vision of a method capable of characterizing full atomic-scale chemical and electronic properties.