AVS 60th International Symposium and Exhibition
    Synchrotron Analysis Focus Topic Tuesday Sessions
       Session SA+AS+MG+SS-TuA

Invited Paper SA+AS+MG+SS-TuA11
Local-Structure Determination Using Combined Fitting of EXAFS and Neutron Total Scattering Data

Tuesday, October 29, 2013, 5:20 pm, Room 203 C

Session: HAXPES Studies on Interfaces and Buried Layers
Presenter: I. Levin, National Institute of Standards and Technology
Correspondent: Click to Email
The functional responses of many industrially-relevant materials are controlled by their local structure – a term that refers to the atomic arrangements on a scale ranging from atomic (sub-nanometer) to several nanometers. Today, multiple experimental techniques exist for probing the local atomic order. Nonetheless, finding accurate comprehensive structural solutions still remains a challenge, because any one of the existing methods yields only a partial view of the structure. In this talk, we will discuss recent advances in local-structure determination using simultaneous fitting of EXAFS, X-ray/neutron total scattering, and electron diffuse scattering data. Examples will include several representative perovskite systems that find use as dielectrics and ferroelectrics.