AVS 60th International Symposium and Exhibition
    Synchrotron Analysis Focus Topic Tuesday Sessions
       Session SA+AS+MG+SS-TuA

Invited Paper SA+AS+MG+SS-TuA1
Past and Present of Synchrotron Radiation, from Hard X-ray Photoemission to Soft X-ray and Back

Tuesday, October 29, 2013, 2:00 pm, Room 203 C

Session: HAXPES Studies on Interfaces and Buried Layers
Presenter: P. Pianetta, Stanford University
Correspondent: Click to Email

Synchrotron radiation has proven to be a very important tool for the study of materials in applications including earth sciences, energy and semiconductors. Most of the early applications focused on the study of surface phenomena using valence and core level spectroscopies using soft x-rays. Although one of the first studies at a multi-GeV synchrotron used hard x-rays, its practical use was limited by low counting rates. With the advent of high brightness synchrotron sources along with highly efficient electron energy analyzers, x-ray photoelectron spectroscopy using multi-keV x-rays has seen a rebirth for the study of buried interfaces and bulk materials properties. This talk will discuss the evolution of synchrotron radiation photoelectron spectroscopy from the early experiments to the present day.