| AVS 59th Annual International Symposium and Exhibition | |
| Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | AS+NS+SS+TF-WeA1 Invited Paper From Atomic Scale to Materials Behavior: Using Atom-Probe Tomography to Understand the Behavior of Alloys and Ceramics E.A. Marquis, University of Michigan |
| 2:40pm | AS+NS+SS+TF-WeA3 Three Dimensional Atomic Scale Characterization of Binary and Complex Oxides using Atom Probe Tomography A. Devaraj, R. Colby, D.E. Perea, S. Thevuthasan, EMSL, Pacific Northwest National Laboratory |
| 3:00pm | AS+NS+SS+TF-WeA4 Atom Probe Tomography of Complex Heterogeneous Low Dimensional Materials S. Thevuthasan, A. Devaraj, R. Colby, D.E. Perea, V. Subramanian, V. Shutthanandan, Pacific Northwest National Laboratory |
| 4:00pm | AS+NS+SS+TF-WeA7 Upgrading a 25 Year Old ims-4f Magnetic Sector SIMS Instrument: Teaching an Old Dog New Tricks and Keeping Research in its Future A.J. Fahey, B.E. Naes, G. Hager, Pacific Northwest National Laboratory |
| 4:20pm | AS+NS+SS+TF-WeA8 Automated Processing of X-ray Photo-Electron Spectra K. Macak, E. Macak, S.J. Coultas, S.J. Hutton, A.J. Roberts, R. Raso, S.J. Page, C.J. Blomfield, Kratos Analytical Ltd, UK |
| 4:40pm | AS+NS+SS+TF-WeA9 Correlating Structure and Chemistry – A Multitechnique Study using Light Microscopy (LM), SEM and XPS M.L. Pacholski, P.Y. Eastman, The Dow Chemical Company |