AVS 59th Annual International Symposium and Exhibition
    Thin Film Thursday Sessions
       Session TF-ThP

Paper TF-ThP5
Advanced Analytical Characterization of Multilayered Thin Films for Corrosion Inhibition

Thursday, November 1, 2012, 6:00 pm, Room Central Hall

Session: Thin Film Poster Session
Presenter: G. Zorn, GE Global Research
Authors: G. Zorn, GE Global Research
M. Karadge, GE Global Research
C.C. Pierce, GE Power & Water
J.I. Melzer, GE Power & Water
M.M. Morra, GE Global Research
Correspondent: Click to Email
Advanced corrosion inhibitors developed by General Electric Power and Water can have complex multilayered structures that incorporate metal, ceramic and polymeric structures. For optimal performance it is important to understand the structure, morphology and composition of different layers. However, characterizing these nano scale films is very challenging, as they can be sensitive to preparation technique and damage. Moreover, surface roughness and homogeneity of the layers should be considered. The challenges in characterizing these multilayered structures will be discussed as an example for thin film characterization in the industrial R&D world. A multi technique approach that provides a detailed view of complex structures and compositions will be presented. Transmission Electron Microscopy (TEM) equipped with EDS was used to define local morphologies, crystalline structures and chemical composition; and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) depth profiles were used to determine the molecular distribution within the different layers. TEM provides local information in the range of a few nanometers over Focused Ion Beam (FIB) cross sections while ToF SIMS allows the analysis of larger areas, in the range of hundreds of nanometers, and provides top down views of the layers. The talk will emphasize how these two methods complement each other to achieve a detailed picture of complex structures within thin films.