| AVS 59th Annual International Symposium and Exhibition | |
| Applied Surface Science | Tuesday Sessions |
| Session AS+BI-TuA |
| Session: | Surface Analysis of Materials Using Vibrational Techniques (2:00-3:20 pm)/ Multi-Technique Analysis (4:00-6:00 pm) |
| Presenter: | C. Szakal, National Institute of Standards and Technology |
| Authors: | C. Szakal, National Institute of Standards and Technology A.R. Konicek, National Institute of Standards and Technology M. Ugelow, National Institute of Standards and Technology D.S. Simons, National Institute of Standards and Technology A. Herzing, National Institute of Standards and Technology R.D. Holbrook, National Institute of Standards and Technology |
| Correspondent: | Click to Email |
Chemical characterization of inorganic particles becomes more difficult as the particle sizes decrease. For application areas ranging from semiconductor failure analysis to nanotoxicology, the distinct chemical signatures of both the surface and bulk of particles can provide insight into system mechanisms and behavior. New methods that aim to explore the surface chemistry of inorganic nanoparticles for both their elemental and organic overlayer signatures will be presented. Specifically, the “static” nature of time-of-flight-secondary ion mass spectrometry is used to provide mass spectral characterization at the very surfaces and sub-surfaces of well-prepared (via drop-on-demand inkjet printing) and well-characterized (via scanning transmission electron microscopy and ultraviolet-visible spectroscopy) nanoparticle aggregates. This information can potentially be combined with full aggregate analysis using more elementally sensitive dynamic SIMS instrumentation once target species are identified with ToF-SIMS. Both sets of SIMS data can be used to obtain a chemical distribution of signals throughout the particle depths. Additionally, the question of whether the centers of inorganic nanoparticle aggregates are chemically similar to the overall aggregate surfaces will be explored.