| AVS 58th Annual International Symposium and Exhibition | |
| Vacuum Technology Division | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | VT-MoM1 Transportable NIST Traceable Vacuum Standards for Secondary Calibration Laboratories and International Key Comparisons Jay H. Hendricks, D.A. Olson, J.E. Ricker, National Institute of Standards and Technology |
| 8:40am | VT-MoM2 Invited Paper Extending the Range of the Spinning Rotor Gage for Vacuum Measurements and Calibrations Michael Duncan, J.A. Keck, Oak Ridge National Laboratory |
| 9:20am | VT-MoM4 Cold Electron Source Used as Electron Source in Familiar Vacuum Measurement Devices Paul Arnold, Brooks Automation, Inc., G.A. Brucker, Brooks Automation, Inc., Granville-Phillips Products |
| 9:40am | VT-MoM5 Review of Thermal Conductivity Vacuum Gauges Martin Wüest, INFICON Ltd, Liechtenstein |
| 10:00am | VT-MoM6 Investigation of the Hot Cathode Ionization Vacuum Gauge; Stability and Reliability on the Point of View of Traceability Naoki Takahashi, ULVAC Inc., Japan |
| 10:40am | VT-MoM8 On the Stability of Capacitance-Diaphragm Gauges with Ceramic Membranes K. Jousten, Physikalisch-Technische Bundesanstalt, Germany, Simon Naef, INFICON Ltd, Liechtenstein |
| 11:00am | VT-MoM9 Thermal Transpiration Effects in Capacitance Diaphragm Gauges with Helicoidal Baffle System Manuel Vargas, Institute of Mechanics - Bulgarian Academy of Sciences, M. Wüest, INFICON Ltd, Liechtenstein, S.K. Stefanov, Institute of Mechanics - Bulgarian Academy of Sciences |
| 11:20am | VT-MoM10 Direct Conductance Measurements of Laser-Drilled Pinhole Apertures James Fedchak, D.R. Defibaugh, National Institute of Standards and Technology |