AVS 58th Annual International Symposium and Exhibition
    Exhibitor Technology Spotlight Tuesday Sessions

Session EW-TuL
Exhibitor Technology Spotlight

Tuesday, November 1, 2011, 12:00 pm, Room West Exhibit Hall
Moderator: R. Langley


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

12:20pm EW-TuL2
New Developments in Surface Analysis from Thermo Fisher Scientific
T.S. Nunney, Richard White, A. Bushell, P. Mack, Thermo Fisher Scientific, UK
12:40pm EW-TuL3
A Complementary Approach to the Chemical and Structural Characterization of Graphene with Raman and X-ray Photoelectron Spectroscopy
Tim Nunney, R.G. White, Thermo Fisher Scientific, UK, M. Wall, Thermo Fisher Scientific, K. Bolotin, Vanderbilt University, H.M. Meyer III, Oak Ridge National Laboratory
1:00pm EW-TuL4
Optimized XPS Depth Profiling of Organic Materials using Polyatomic Ion Sources
D. Surman, Kratos Analytical Inc., C. Blomfield, A. Roberts, S. Page, Kratos Analytical Ltd., UK
1:20pm EW-TuL5
Advances in XPS Chemical Imaging and Depth Profiling
John Hammond, D.G. Watson, P.E. Larson, S.N. Raman, Physical Electronics