| AVS 58th Annual International Symposium and Exhibition | |
| Applied Surface Science Division | Wednesday Sessions |
| Session AS+BI+NS-WeM |
| Session: | Advances in Scanning Probe Microscopy |
| Presenter: | Xi Chen, University of Pennsylvania |
| Authors: | X. Chen, University of Pennsylvania K. Kathan-Galipeau, University of Pennsylvania B.M. Discher, University of Pennsylvania D.A. Bonnell, University of Pennsylvania |
| Correspondent: | Click to Email |