| AVS 57th International Symposium & Exhibition | |
| Graphene Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | GR+AS+TF+MI-ThA1 Invited Paper Scanning Tunneling Microscopy and Spectroscopy of Impurities on a Gated Graphene Device R.T. Decker, V.W. Brar, M.H. Solowan, Y.C. Wang, A. Zettl, M.F. Crommie, University of California Berkeley |
| 2:40pm | GR+AS+TF+MI-ThA3 Graphene Defect States in a Magnetic Field Studied by Scanning Tunneling Spectroscopy K.D. Kubista, D.L. Miller, M. Ruan, W.A. de Heer, P.N. First, Georgia Institute of Technology, G.M. Rutter, J.A. Stroscio, National Institute of Standards and Technology |
| 3:00pm | GR+AS+TF+MI-ThA4 Atomic-Scale Maps of Quantum Hall States in Epitaxial Graphene D.L. Miller, K.D. Kubista, Georgia Institute of Technology, G.M. Rutter, National Institute of Standards and Technology, M. Ruan, W.A. de Heer, P.N. First, Georgia Institute of Technology, J.A. Stroscio, National Institute of Standards and Technology |
| 3:40pm | GR+AS+TF+MI-ThA6 Invited Paper Imperfect Graphene: Point Defects, Edges, Dislocations and Grain Boundaries O.V. Yazyev, University of California, Berkeley |
| 4:20pm | GR+AS+TF+MI-ThA8 Spectroscopic Ellipsometry for Thickness Measurement and Optical Dispersion Modeling of CVD-Grown Graphene F.J. Nelson, V.K. Kamineni, A.C. Diebold, The University at Albany-SUNY |