| AVS 57th International Symposium & Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | EL+AS+EM+MS+TF-FrM1 Spectroscopic Ellipsometry Study on Transparent Conductive Ga-doped ZnO Thin Films Deposited by Ion-Plating with DC Arc Discharge T. Yamada, H. Makino, N. Yamamoto, T. Yamamoto, Kochi University of Technology, Japan |
| 8:40am | EL+AS+EM+MS+TF-FrM2 Spectroscopic Ellipsometry of Pulsed Laser Deposited ZnO on Atomic Layer Deposited Al2O3 and HfO2 D.L. Agresta, K.D. Leedy, U.S. Air Force Research Laboratory |
| 9:00am | EL+AS+EM+MS+TF-FrM3 Processing and Stability Studies of Vanadium Oxide Thin Films for Microbolometer Applications M.A. Motyka, B.D. Gauntt, E.C. Dickey, M.W. Horn, N.J. Podraza, Penn State University |
| 9:40am | EL+AS+EM+MS+TF-FrM5 Invited Paper Roughness beyond Bruggeman's Effective Medium Approximation H. Wormeester, University of Twente, Netherlands |
| 10:20am | EL+AS+EM+MS+TF-FrM7 Spectroscopic Ellipsometry on Graphene J.W. Weber, Eindhoven University of Technology, Netherlands, V.E. Calado, Delft University of Technology, Netherlands, M.C.M. van de Sanden, Eindhoven University of Technology, Netherlands |
| 10:40am | EL+AS+EM+MS+TF-FrM8 Free-charge Carrier Properties of Epitaxial Graphene by Terahertz and Infrared Ellipsometry T. Hofmann, A. Boosalis, P. Kühne, University of Nebraska-Lincoln, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy, Jr., D.K. Gaskill, U.S. Naval Research Laboratory, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, Cornell University, M. Schubert, University of Nebraska-Lincoln |
| 11:00am | EL+AS+EM+MS+TF-FrM9 Mueller-Matrix Studies of Scarab Beetles using Spectroscopic Ellipsometry and Imaging Polarimetry H. Arwin, Linköping University, Sweden, S. Manhas, LPICM, CNRS, Ecole Polytechnique, France, J. Landin, K. Järrendahl, Linköping University, Sweden, A. De Martino, LPICM, CNRS, Ecole Polytechnique, France |
| 11:20am | EL+AS+EM+MS+TF-FrM10 Agent-Free Bio-Chemical Sensing with Sculptured Thin Films D. Schmidt, K.B. Rodenhausen, S. Schöche, T. Hofmann, E.B. Schubert, M. Schubert, University of Nebraska-Lincoln |