AVS 57th International Symposium & Exhibition
    Applied Surface Science Thursday Sessions

Session AS2-ThM
Forensics, Failure Analysis, and Practical Surface Analysis

Thursday, October 21, 2010, 8:00 am, Room Cochiti A
Moderator: I.S. Gilmore, National Physical Laboratory, UK

  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

10:40am AS2-ThM9 Invited Paper
Characterization of Composition C4 Explosives using Time-of-Flight Secondary Ion Mass Sepctrometry (ToF-SIMS) and X-Ray Photoelectron Spectroscopy (XPS)
C. Mahoney, K.L. Steffens, A.J. Fahey, B.A. Benner, National Institute of Standards and Technology, R.T. Lareau, Transportation Security Laboratory
11:20am AS2-ThM11
Chemical Speciation of Engineered Nanoparticle Surface Chemistry with Secondary Ion Mass Spectrometry
C. Szakal, R.D. Holbrook, National Institute of Standards and Technology
11:40am AS2-ThM12
Complementary XPS and SEM/EDS Characterization of Gunshot Residue (GSR)
A.J. Schwoeble, B.R. Strohmeier, J.D. Piasecki, RJ Lee Group, Inc.