Invited Paper AS2-ThM9
Characterization of Composition C4 Explosives using Time-of-Flight Secondary Ion Mass Sepctrometry (ToF-SIMS) and X-Ray Photoelectron Spectroscopy (XPS)

Thursday, October 21, 2010, 10:40 am, Room Cochiti A

Over the past decade, we at the National Institute of Standards and Technology have been working closely with the Department of Homeland Security to stop the threat of terrorist-based attacks in the form of explosives or explosive-based devices. Our program encompasses many different aspects of this threat, from development of measurement standards for trace explosives detection at airports, to the development and application of new metrology for the characterization these explosives. Here we present, to our knowledge, the first investigation into the application of surface analytical techniques, such as Secondary Ion Mass Spectrometry (SIMS) and X-Ray Photoelectron Spectroscopy (XPS) for the characterization and differentiation of plastic explosives. This particular work is focused on the characterization of composition C-4 explosives from several different regions.

Unlike traditional analytical techniques such as GCMS and/or LCMS, these powerful surface analytical tools allow for the simultaneous and direct characterization of all the components in C-4 (explosive components, additives, binders, contaminants etc.), as opposed to a partial analysis of extracted portions. Furthermore, the characterization of the explosive samples with ToF-SIMS and XPS will enable rapid identification of both organic and inorganic constituents as well as their characteristic isotopic abundances with excellent sensitivity. Most importantly, these techniques are well-suited for direct analysis of small explosive particulates collected directly in the field, and are already employed for homeland security applications that effect national policy.