AVS 57th International Symposium & Exhibition | |
Vacuum Technology | Monday Sessions |
Session VT+MS-MoA |
Session: | Gas Analysis in Vacuum and Process Applications |
Presenter: | G. Brucker, Brooks Automation, Inc. |
Authors: | G. Brucker, Brooks Automation, Inc. J. Rathbone, Brooks Automation, Inc. K. Van Antwerp, Brooks Automation, Inc. M.N. Schott, Brooks Automation, Inc. |
Correspondent: | Click to Email |
Low mass range mass spectrometers are routinely used to obtain partial pressure information in high vacuum and ultrahigh vacuum systems. Absolute and ratiometric partial pressure measurements are both applied to monitor and control vacuum processes and experiments. Mass spectrometers provide indirect partial pressure measurements, and require advanced data interpretation and analysis procedures in order to generate accurate partial pressure measurements from their raw spectral output. This presentation describes some of the modern methodologies used by commercial equipment manufacturers to derive accurate absolute and ratiometric partial pressure information using both quadrupole mass spectrometers and a new generation of electrostatic ion trap mass spectrometers. The advantages of combining accurate total pressure readings with native ratiometric partial pressure information from electrostatic ion traps is also described and compared to standard partial pressure measurement methodologies. Fast process control, in the millisecond timescale, based on partial and total pressure measurements is also described.