AVS 57th International Symposium & Exhibition | |
MEMS and NEMS | Friday Sessions |
Session MN-FrM |
Session: | Characterization for MEMS and NEMS |
Presenter: | H. Lee, The Ohio State University |
Authors: | B. Bhushan, The Ohio State University H. Lee, The Ohio State University S. Chaparala, Corning Incorporated V. Bhatia, Corning Incorporated |
Correspondent: | Click to Email |