| AVS 57th International Symposium & Exhibition | |
| MEMS and NEMS | Friday Sessions |
| Session MN-FrM |
| Session: | Characterization for MEMS and NEMS |
| Presenter: | H. Lee, The Ohio State University |
| Authors: | B. Bhushan, The Ohio State University H. Lee, The Ohio State University S. Chaparala, Corning Incorporated V. Bhatia, Corning Incorporated |
| Correspondent: | Click to Email |