AVS 57th International Symposium & Exhibition | |
MEMS and NEMS | Friday Sessions |
Session MN-FrM |
Session: | Characterization for MEMS and NEMS |
Presenter: | R.B. Ilic, Cornell University |
Authors: | R.B. Ilic, Cornell University S.L. Krylov, Tel Aviv University, Israel H.G. Craighead, Cornell University |
Correspondent: | Click to Email |