AVS 56th International Symposium & Exhibition | |
Surface Science | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
8:20am | SS2-FrM1 Observation of Realtime Oxidation of Si(111) Surfaces using Second Harmonic Generation K. Gundogdu, B. Gokce, E.J. Adles, D.E. Aspnes, North Carolina State University |
8:40am | SS2-FrM2 Surface Passivation Mechanism of Atomic Layer Deposited Al2O3 Films on c-Si Studied by Optical Second-Harmonic Generation N.M. Terlinden, J.J.H. Gielis, V. Verlaan, G. Dingemans, M.C.M. van de Sanden, W.M.M. Kessels, Eindhoven University of Technology, Netherlands |
9:00am | SS2-FrM3 Influence of Alkali-Metal Adsorption on Phase Transition of In/Si(111)-4 × 1 Surface H. Shim, W. Lee, G. Lee, Inha University, Republic of Korea, S. Yu, J. Koo, Korea Research Institute of Standards and Science |
9:20am | SS2-FrM4 The First Attachment of Polybutadiene and Functionalized Polybutadiene to Hydrogen-Terminated Silicon, with Post-Derivitization of these Adsorbed Species E. Nelsen, T. Wickard, Brigham Young University, H. Schlaad, Max Planck Institute of Colloids and Interfaces, Germany, R.C. Davis, M.R. Linford, Brigham Young University |
9:40am | SS2-FrM5 Mechanistic Study of Photochemical Grafting of Alkenes to Group IV Semiconductors X. Wang, J. Streifer, P. Colavita, R.J. Hamers, University of Wisconsin-Madison |
10:00am | SS2-FrM6 Structure and Order of Organophosphonate Self-Assembled Monolayers on Si(100) M. Dubey, T. Weidner, L.J. Gamble, D. Ratner, D.G. Castner, University of Washington |
10:20am | SS2-FrM7 Hydrogen-bond Mediated Chemistry of Glycine on Si(111)7×7: A Catch-And-Release Approach to Surface Functionalization K.T. Leung, University of Waterloo, Canada |
10:40am | SS2-FrM8 Site-selective Reactivity of Ethylene on Si(001) induced by Local Electronic Distortions G. Mette, C.H. Schwalb, Uni Marburg, Germany, M. Dürr, Hochschule Esslingen, Germany, U. Höfer, Uni Marburg, Germany |
11:00am | SS2-FrM9 Identifying Adsorbate Structures on Semiconductor Surfaces Using Simulated Scanning Tunneling Microscope Images L. Yang, D. Doren, University of Delaware |
11:20am | SS2-FrM10 Defect Engineering via Modification of Semiconductor-Oxide Interfaces P. Gorai, Y. Kondratenko, E.G. Seebauer, University of Illinois at Urbana-Champaign |