AVS 56th International Symposium & Exhibition
    Advanced Surface Engineering Tuesday Sessions

Session SE+TF-TuA
Glancing Angle Deposition II

Tuesday, November 10, 2009, 2:00 pm, Room C4
Moderator: K. Robbie, Queen's University, Canada


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:00pm SE+TF-TuA1 Invited Paper
Deposited Nanorod Films for Biosensor Applications
W. Zhang, University of Illinois at Urbana-Champaign, S.M. Kim, Chung-Ang University, Korea, N. Ganesh, Intel, I. Block, P. Mathias, B.T. Cunningham, University of Illinois at Urbana-Champaign
2:40pm SE+TF-TuA3
Surface Enhanced Raman Scattering from Silver Nanorod Array Substrates: Characteristics and Origin
Y. Liu, Z. Zhang, R.D. Dluhy, Y. Zhao, University of Georgia
3:00pm SE+TF-TuA4
Local Plasmon Resonators Combinatorially-Multilayered by Oblique Angle Deposition Technique
M. Suzuki, R. Tabuchi, Y. Imai, S. Li, K. Nakajima, K. Kimura, Kyoto University, Japan, T. Fukuoka, Archilys RP, Japan
4:00pm SE+TF-TuA7
Influence of Substrate Temperature on Glancing Angle Deposited Ag Nanorods
C. Khare, C. Patzig, J.W. Gerlach, Leibniz-Institut of Surface Modification, Germany, B. Fuhrmann, Martin-Luther-University Halle, Germany, B. Rauschenbach, Leibniz-Institut of Surface Modification, Germany
4:20pm SE+TF-TuA8
Temperature Driven Anomalous Scaling during Glancing Angle Deposition
S. Mukherjee, D. Gall, Rensselaer Polytechnic Institute
4:40pm SE+TF-TuA9
Investigation of Surface Sensitivity of Relative Humidity Sensors through ALD Coated GLAD
M.T. Taschuk, University of Alberta, Canada, K.D. Harris, J.M. Buriak, M.J. Brett, NRC National Institute for Nanotechnology, Canada
5:00pm SE+TF-TuA10
Direct Measurement of Porosity in Glancing Angle Deposited Thin Films
A.R. Gonzalez-Elipe, ICMSE (CSIC - U. Seville), Spain, F. Yubero, CSIC, Spain, J.R. Sanchez-Valencia, ICMSE (CSIC - U. Seville), Spain
5:20pm SE+TF-TuA11
Monoclinic Magnetic Anisotropy and Hybridization of GLAD Sculptured Thin Films
A. Kjerstad, D. Schmidt, T. Hofman, M. Schubert, E. Schubert, R. Skomski, D. Sellmeyer, University of Nebraska - Lincoln