AVS 56th International Symposium & Exhibition | |
Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
8:00am | AS-WeM1 Probing Photoinduced Charging in CdS and CdSe Films by Dynamical XPS Measurements H. Sezen, S. Suzer, Bilkent University, Turkey |
8:20am | AS-WeM2 Energy Filtered PhotoElectron Microscopy K. Winkler, M. Maier, Omicron NanoTechnology GmbH, Germany, M.E. Escher, Focus GmbH, Germany, B. Kroemker, D. Funnemann, Omicron NanoTechnology GmbH, Germany |
9:00am | AS-WeM4 Some Problems of Quantitative Applications of High (up to 15 keV) Energy X-ray Photoelectron Spectroscopy L. Kover, Institute of Nuclear Research of the HAS, Hungary |
9:20am | AS-WeM5 Invited Paper Hydrogen Quantification at Surfaces by Electron Spectroscopy F. Yubero, CSIC, Spain |
10:40am | AS-WeM9 Hot Electron Transport Properties of Thin Copper Films Using Ballistic Electron Emission Microscopy J.J. Garramone, J.R. Abel, I.L. Sitnitsky, University at Albany, L. Zhao, I. Appelbaum, University of Maryland, V.P. LaBella, University at Albany |
11:00am | AS-WeM10 XPS Imaging Techniques for the Chemical Characterization of Fuel Cell Membrane Electrode Assemblies A.E. Wright, T.S. Nunney, R.G. White, Thermo Fisher Scientific, UK, K.S. Reeves, K.L. More, H.M. Meyer III, Oak Ridge National Laboratory |
11:20am | AS-WeM11 Formation of Hydroxyapatite Films on Thin Etridonate Films formed on Stainless Steel and Titanium Studied by Core and Valence Band XPS - A Potentially Biocompatible Surface for Implants F. Gao, P. Sherwood, Oklahoma State University |
11:40am | AS-WeM12 Enhancing Information Extracted from XPS Spectra using a Near Real-Time Data Analysis Package A.S. Lea, K.R. Swanson, J.R. Haack, M.H. Engelhard, D.R. Sisk, D.R. Baer, Pacific Northwest National Laboratory, J.E. Castle, University of Surrey, UK, S. Tougaard, University of Southern Denmark |