AVS 56th International Symposium & Exhibition
    Applied Surface Science Thursday Sessions

Session AS-ThA
Chemical State Depth Profiling

Thursday, November 12, 2009, 2:00 pm, Room C2
Moderator: G.L. Fisher, Physical Electronics


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Click a paper to see the details. Presenters are shown in bold type.

2:00pm AS-ThA1
Factors Affecting XPS Sputter Depth Profiling of Organic Materials
S.J. Hutton, I.W. Drummond, S.C. Page, C.J. Blomfield, Kratos Analytical Ltd, UK
2:20pm AS-ThA2
On the Understanding and Optimization of Etching Parameters for Optimal ToF-SIMS 2D and 3D Analysis of Biological Cells
J. Brison, D.S.W. Benoit, M. Dubey, M. Robinson, P.S. Stayton, D.G. Castner, University of Washington
2:40pm AS-ThA3
On the Way to Optimal 3D Molecular Imaging with ToF-SIMS: A Comparison between C60 Single Beam and Bin/C60 Dual Beam Depth Profiling
J. Brison, S. Muramoto, D.G. Castner, University of Washington
3:40pm AS-ThA6 Invited Paper
Teaching Laser Desorption Mass Spectrometry Old and New Tricks in Postionization and Depth Profiling
L. Hanley, University of Illinois at Chicago
4:20pm AS-ThA8
Surface Damage Evaluation of Organic Materials Irradiated with Ar Cluster Ions
J. Matsuo, S. Ninomiya, K. Ichiki, H. Yamada, M. Hada, T. Aoki, T. Seki, Kyoto University, Japan
4:40pm AS-ThA9
Optimization of C60 Sputtering Conditions for Polymer Depth Profiling by TOF-SIMS
S.R. Bryan, Physical Electronics, S. Iida, ULVAC-PHI, Japan, G.L. Fisher, J.S. Hammond, Physical Electronics, N. Sanada, M. Suzuki, ULVAC-PHI, Japan
5:00pm AS-ThA10
Metrics for Polymer Depth Profiling with C60 Ion Sources
J.S. Hammond, S.S. Alnabulsi, S.N. Raman, J.F. Moulder, Physical Electronics
5:20pm AS-ThA11
Organic Depth Profiling of a Model Binary System: The Demonstration of Charge Transfer between Secondary Species
A.G. Shard, National Physical Laboratory, UK, A. Rafati, University of Nottingham, UK, J.L.S. Lee, National Physical Laboratory, UK, M.R. Alexander, M.C. Davies, University of Nottingham, UK