AVS 56th International Symposium & Exhibition | |
Applied Surface Science | Wednesday Sessions |
Session AS-WeA |
Session: | Angle-resolved X-ray Photoelectron Spectroscopy |
Presenter: | R.G. White, Thermo Fisher Scientific, UK |
Authors: | P. Mack, Thermo Fisher Scientific, UK R.G. White, Thermo Fisher Scientific, UK J. Wolstenholme, Thermo Fisher Scientific, UK E.H. Lock, Naval Research Laboratory S.G. Walton, Naval Research Laboratory D.Y. Petrovykh, Naval Research Laboratory and University of Maryland, College Park |
Correspondent: | Click to Email |
This approach has been applied to characterize the surfaces generated by a new, low-energy plasma treatment. Polystyrene films, modified by a variety of plasmas, were analysed using parallel angle resolved XPS (PARXPS). An evaluation of different methods of ARXPS depth profile reconstruction was performed, comparing “boxcar” and “Cumpson” models with maximum entropy method results. The maximum entropy calculations employed the genetic algorithm to search for the optimum solutions. The non-destructively measured PARXPS profiles were compared with low-energy argon sputter profiles of the polymer surfaces.
Additionally, angle resolved reflection electron energy loss spectroscopy (AREELS) measurements were performed, giving depth-dependent information on the level of carbon unsaturation in the plasma-modified regions of the surface.
This work was supported by the Office of Naval Research.
E. H. Lock is NRL/NRC Postdoctoral Research Associate.