Ultra-Thin films, Nano-Particles and Nano-Wires are at the center of research for new materials for use in Photonics, Nano-Electronics and Advanced Energy Conversion and Storage. Metals, Semiconductors, Glasses and Polymers are all being investigated for these applications. Understanding the structure, composition and chemistry of these new materials is essential in advancing their development.

X-ray Photoelectron Spectroscopy (XPS) is one of the most commonly used surface techniques for quantitative measurements of elemental composition and specific chemical information of surface constituents. Angle Resolved XPS and XPS combined with ion sputtering can provide information beyond the surface of the material. There are some limitations, however, in the special resolution of XPS.

Auger Electron Spectroscopy (AES) can provided elemental information with high spatial resolution. This is extremely useful in obtaining localized information from Nano Particles and Nano Wires.

The combination of the XPS and AES techniques can further advance the development of these new material. In this presentation we will look at complimenting and correlating data obtained by XPS and AES from a variety of advanced materials from a host of application areas.