| AVS 53rd International Symposium | |
| Thin Film | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | TF-ThM1 Tilted Fiber Texture in Aluminum Nitride Thin Films J.M.E. Harper, D. Deniz, University of New Hampshire, J.W. Hoehn, F. Chen, Seagate Technology Inc. |
| 8:20am | TF-ThM2 CVD of Titanium Diboride using Single Source Precursor N. Kumar, Y. Yang, W. Noh, G. Girolami, J. Abelson, University of Illinois Urbana-Champaign |
| 8:40am | TF-ThM3 Invited Paper Fundamentals in Thin Film Pulsed Laser Deposition: Growth Control at an Atomic Level D.H.A. Blank, University of Twente and MESA+ Institute for Nanotechnology, The Netherlands |
| 9:20am | TF-ThM5 Solvation Effects in the Kinetics of Supercritical CO@sub 2@ Based Deposition of Metal Oxide Thin Films Q. Peng, K.J. Park, D. Hojo, D. Barua, G.N. Parsons, North Carolina State University |
| 9:40am | TF-ThM6 Formation of c-Si/a-Si:H Interfaces Studied by Real-Time Second-Harmonic Generation, Spectroscopic Ellipsometry, and Infrared Spectroscopy J.J.H. Gielis, P.J. van den Oever, B. Hoex, M.C.M. Van De Sanden, W.M.M. Kessels, Eindhoven University of Technology, The Netherlands |
| 10:00am | TF-ThM7 Kinetic Pathways Leading to Layer-By-Layer Growth: A Multibllion Time-Step Molecular Dynamics Study V. Chirita, D. Adamovic, E.P. Münger, L. Hultman, Linköping University, Sweden, J.E. Greene, University of Illinois, Urbana |
| 10:20am | TF-ThM8 Interpretation of the Roughness in Au(111) Polycrystalline Films E. Rodriguez-Canas, Instituto de Ciencia de Materiales de Madrid (CSIC), Spain, J.A. Aznarez, Instituto de Fisica Aplicada (CSIC), Spain, E. Vasco, J.L. Sacedon, Instituto de Ciencia de Materiales de Madrid (CSIC), Spain |