| AVS 53rd International Symposium | |
| Nanometer-scale Science and Technology | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | NS-FrM2 Double-Sided Epitaxy on Si Nanowire Ribbons* C.S. Ritz, F.S. Flack, University of Wisconsin, Madison, Y. Zhang, F. Liu, University of Utah, M.G. Lagally, University of Wisconsin, Madison |
| 8:40am | NS-FrM3 Silicidation and Oxidation of Silicon Nanowires B.Z. Liu, Y. Wang, S.M. Dilts, J.M. Redwing, T.S. Mayer, S.E. Mohney, The Pennsylvania State University |
| 9:00am | NS-FrM4 Large Area, Dense Si Nanowire Array Chemical Sensors A.A. Talin, L.L. Hunter, B. Rokad, F. Leonard, B.A. Simmons, Sandia National Laboratories |
| 9:20am | NS-FrM5 Controlling the Width of Self Assembled Nanowires on the Si(001) Surface J. Nogami, Y. Cui, J. Chung, D. Grozea, University of Toronto, Canada, C. Ohbuchi, National Institute for Materials Science, Japan |
| 9:40am | NS-FrM6 Synthesis and Characterization of Aligned III-Nitride Nanowire and Heterostructure Nanowire Arrays G.T. Wang, A.A. Talin, J.R. Creighton, Sandia National Laboratories, D. Werder, Los Alamos National Laboratory, E. Lai, P.P. Provencio, Sandia National Laboratories |
| 10:00am | NS-FrM7 Invited Paper Epitaxially Grown III-V Nanowires for Quantum Device Applications L. Samuelson, Lund University, Sweden |
| 10:40am | NS-FrM9 Electrical Characterization of Nanowires with the LEEPS Microscope D.H. Weber, A. Beyer, A. Gölzhäuser, University of Bielefeld, Germany |
| 11:00am | NS-FrM10 Germanium Nanocrystals and Nanowires: Morphological Control, Surface Characterization, and Applications H. Gerung, L.J. Tribby, University of New Mexico, T.N. Lambert, Sandia National Laboratories, N. Andrews, University of New Mexico, T.J. Boyle, Sandia National Laboratories, C.J. Brinker, J.M. Oliver, S.M. Han, University of New Mexico |
| 11:20am | NS-FrM11 Fabrication of Tin Oxide Nanowires Based Nano-Micro Sensor for Room Temperature Hydrogen Detection S. Deshpande, A. Karakoti, G. Londe, H.J. Cho, S. Seal, University of Central Florida |
| 11:40am | NS-FrM12 Atomic Level Analysis of Carbon Nanotubes and Graphite Nanofibers by the Scanning Atom Probe O. Nishikawa, M. Taniguchi, Kanazawa Institute of Technology, Japan |