| AVS 53rd International Symposium | |
| Applied Surface Science | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | AS-MoA1 Molecular Structure - G-SIMS with SMILES I.S. Gilmore, F.M. Green, M.P. Seah, National Physical Laboratory, UK |
| 2:20pm | AS-MoA2 Strategies for ToF-SIMS Data Complexity Reduction: A Comparison of G-SIMS and Multivariate Analysis Applied to PLGA Biopolymer Systems F.J.M. Rutten, R. Ogaki, The University of Nottingham, UK, S. Li, M. Vert, University of Montpellier, France, M.R. Alexander, The University of Nottingham, UK, I.S. Gilmore, National Physical Laboratory, UK, M.C. Davies, The University of Nottingham, UK |
| 2:40pm | AS-MoA3 Invited Paper Multivariate Analysis of Correlated Spectral Images J.A. Ohlhausen, M.R. Keenan, P.G. Kotula, Sandia National Laboratories, V.S. Smentkowski, General Electric Global Research Center |
| 3:20pm | AS-MoA5 X-ray Photoelectron Spectroscopy (XPS) Multi-Spectral Imaging of Aluminum Alloy Surfaces using Principle Component Analysis C.H. Lee, J. Walton, G.E. Thompson, University of Manchester, UK, M.R. Alexander, University of Nottingham, UK |
| 3:40pm | AS-MoA6 High Spatial Resolution XPS and AES Applied to the Understanding of Interfacial Delamination in Microelectronics H. Piao, L. Le Tarte, General Electric Co., N. Fairley, Casa Software Ltd. |
| 4:00pm | AS-MoA7 Structure Elucidation of Nano-Composite Catalysts by Multivariate Analysis and Regression Modeling of XPS Data K. Artyushkova, J.E. Fulghum, T.S. Olson, P. Atanassov, University of New Mexico |
| 4:20pm | AS-MoA8 Attenuation Lengths for Measurement of SiO@sub 2@ Film Thicknesses by XPS C.J. Powell, National Institute of Standards and Technology, W.S.M. Werner, W. Smekal, Technical University of Vienna, Austria |