AVS 53rd International Symposium
    Thin Film Friday Sessions
       Session TF+EM-FrM

Paper TF+EM-FrM11
In-situ and Real-Time Spectroscopic Ellipsometry on Organic Semiconductors during Growth

Friday, November 17, 2006, 11:20 am, Room 2022

Session: In-Situ/Ex-Situ & Real-Time Monitoring and Characterization
Presenter: F. Schreiber, Universit@um a@t T@um u@bingen, Germany
Authors: U. Heinemeyer, Universit@um a@t T@um u@bingen, Germany
S.M. Kowarik, Oxford University, UK
A. Gerlach, Universit@um a@t T@um u@bingen, Germany
F. Schreiber, Universit@um a@t T@um u@bingen, Germany
G. Humphreys, Oxford University, UK
R. Jacobs, Oxford University, UK
Correspondent: Click to Email
We demonstrate the use of in-situ and real-time spectroscopic ellipsometry as a non-invasive technique for following the growth of organic semiconductor thin films of diindenoperylene and pentacene. It is possible to take spectra in the spectral range between 1.25eV and 5 eV sufficiently fast (~ 1 sec) to follow organic molecular beam deposition in detail. We show how this technique can be used to detect spectral changes occurring during growth of these complex materials. From the vibrational progression of the HOMO-LUMO transition we analyze the time/thickness evolution of the exciton-phonon (Huang-Rhys) parameter S. We discuss our results and their implications for organic device fabrication in the context of a recent real-time structural study which found structural and orientational transitions during growth.@footnote 1@ @FootnoteText@ @footnote 1@S. Kowarik et al., Phys. Rev. Lett. 96, 125504 (2006).