AVS 53rd International Symposium
    MEMS and NEMS Tuesday Sessions
       Session MN-TuM

Invited Paper MN-TuM1
Controlled Fabrication of Nanotube Devices using Nanotubes of Known (n,m) Indices

Tuesday, November 14, 2006, 8:00 am, Room 2007

Session: Material Aspects of MEMS and NEMS
Presenter: J. Hone, Columbia University
Correspondent: Click to Email

Because small changes in the crystal structure (chirality) of carbon nanotubes can produce large changes in their electrical properties, it is important to understand the relationship between structure and transport properties, both for basic science and for applications. However, detailed experimental exploration of this relationship has proved elusive so far. Using a mechanical transfer technique in parallel with efforts to combine optical scattering and structural characteriztion, we have achieved the goal of placing 'the nanotube we want, where we want it.' Long suspended tubes are first grown by CVD and inspected optically. Rayleigh scattering spectroscopy can readily discern between metallic and semiconducting nanotubes, and can be correlated with direct structural probes to provide the exact (n,m) structure. After optical characterization, a chosen nanotube can be transferred to a substrate in the desired location, and devices fabricated using standard e-beam lithography techniques. We have fabricated a number of devices in this manner and are beginning to fully explore the detailed relationship between structure and transport.