AVS 53rd International Symposium
    Applied Surface Science Thursday Sessions
       Session AS-ThA

Paper AS-ThA7
Optimised XPS Depth Profiling of Aluminium Surfaces

Thursday, November 16, 2006, 4:00 pm, Room 2005

Session: Combined Methods or Multiple Methods
Presenter: C. Blomfield, Kratos Analytical Ltd, UK
Authors: C. Blomfield, Kratos Analytical Ltd, UK
A.J. Roberts, Kratos Analytical Ltd, UK
J.C. Walmsley, Sintef, Trondeim Norway
Correspondent: email address not available
Characterization is a key activity within aluminum surface science technology. Corrosion and protection mechanism studies are one of a number of areas of study that also include coatings, joining processes, chemical processing, lubrication, rolling and extrusion. The behavior of trace and impurity elements in aluminum alloys is of interest and it is essential to have effective surface characterization tools to study these. Surface and near-surface segregation studies of model aluminum alloys will be used to illustrate the complementary information that can be obtained from different techniques and how this can be related to the properties of the surface. A combination of low-energy ion gun technology, small area analysis, sample rotation and increased instrumental sensitivity have come together to make XPS particularly suited to analysis of the role of trace elements in surface segregation.