AVS 53rd International Symposium
    Applied Surface Science Thursday Sessions
       Session AS-ThA

Paper AS-ThA1
A Fundamental Investigation of Erucamide Migration in Polyolefin Matrices

Thursday, November 16, 2006, 2:00 pm, Room 2005

Session: Combined Methods or Multiple Methods
Presenter: J. Chen, The Dow Chemical Company
Authors: J. Chen, The Dow Chemical Company
B. Walther, The Dow Chemical Company
J. Li, The Dow Chemical Company
T. Hu, The Dow Chemical Company
Correspondent: Click to Email
Erucamide is the most widely used slip agent in plastic manufacturing processes. It is well know that erucamide migrates toward the surface leading to a reduction in the coefficient of friction (COF), but not much has been published on the details of the surface migration. Our study has shown that the surface layer of erucamide is a function of many factors including the matrix material and thickness, temperature shelf time and other factors. X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF SIMS), atomic force microscopy (AFM) and other technologies were applied to develop fundamental understanding of the erucamide migration mechanism and the correlation with COF. This paper will discuss our fundamental investigations of surface migration of erucamide through polyolefin resins.