AVS 53rd International Symposium | |
Applied Surface Science | Friday Sessions |
Session AS-FrM |
Session: | Thin Film Characterization |
Presenter: | M.M. Beerbom, University of South Florida |
Authors: | M.M. Beerbom, University of South Florida Y. Yi, University of South Florida J.E. Lyon, University of South Florida A.J. Cascio, University of South Florida J.P. Magulick, University of South Florida R. Schlaf, University of South Florida |
Correspondent: | Click to Email |