AVS 52nd International Symposium
    MEMS and NEMS Monday Sessions

Session MN-MoM
Processing & Characterization of Materials for MEMS & NEMS

Monday, October 31, 2005, 8:20 am, Room 207
Moderator: S. Burkett, University of Arkansas


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:20am MN-MoM1
Mechanical Properties of Polysilicon Thin Films using Micromachined Membranes and a Design of Experiments Methodology
A.J. Fleischman, A. Dubnisheva, R.S. Butler, The Cleveland Clinic Foundation, R. Rosenblum, C.A. Zorman, Case Western Reserve University, S. Roy, The Cleveland Clinic Foundation
8:40am MN-MoM2
Characterization of Nanoscale Wear Processes in Polysilicon-Based MEMS Devices using AFM and PEEM-NEXAFS Spectromicroscopy
A.V. Sumant, D.S. Grierson, G. Wabiszewski, R.W. Carpick, University of Wisconsin at Madison, A. Corwin, M. De Boer, Sandia National Laboratories
9:00am MN-MoM3 Invited Paper
Science and Technology of Ultrananocrystalline Diamond Thin Films and Their Integration for Fabrication of Advanced MEMS/NEMS
O. Auciello, Argonne National Lab, J. Birrell, Presently with Advanced Diamond Technologies, J.A. Carlisle, Argonne National Lab, K.-H. Kim, B. Peng, H.D. Espinosa, Northwestern Univ., A.V. Sumant, D.S. Grierson, N. Guoqing, R.W. Carpick, Univ. of Wisconsin-Madison
9:40am MN-MoM5
Quantitative Work-of-Adhesion Values for use as an In-Fab Monitor of Stiction
E.J. Thoreson, Worcester Polytechnic Institute, J. Martin, Analog Devices, Inc., N.A. Burnham, Worcester Polytechnic Institute
10:00am MN-MoM6
An SPM-Based System for Contact Reliability Characterization
L. Chen, N. McGruer, G. Adams, Northeastern University, R. Coutu, K. Leedy, Air Force Research Laboratory
10:20am MN-MoM7
Surface Chemistry of Organosilanes as a Vapor Phase Lubricant for Si-based MEMS Applications
D. Kim, A.J. Gellman, Carnegie Mellon University
10:40am MN-MoM8
Post-Processing Curvature Modification of Cantilever Microbolometer Focal Plane Arrays
S. Huang, X. Zhang, Boston University
11:00am MN-MoM9
Using Geometric Moiré to Measure the Deformation in Polymeric Nanostructures
Y. Zhao, X. Zhang, Boston University
11:20am MN-MoM10
High Sensitivity and Broad Dynamic Range MEMS Humidity Sensor
A. Zribi, W.-C. Tian, A. Knobloch, GE Global Research Center
11:40am MN-MoM11
Vacuum Packaging MEMS Devices
R. Patel, M.U. Pralle, E.A. Johnson, A.C. Greenwald, Ion Optics, Inc.